제품 사양

SLD XE AFM Head
▪ Detects the deflection of a cantilever using SLD (Super Luminescence Diode) for topography feedback
- Center wavelength: 830 nm
▪ Includes a high force Z-scanner with guided flexure stage
- Scan range: 12 μm
▪ Includes a Standard Probehand where a cantilever is attached.
- Angle of the cantilever to the horizontal plane: 12 degrees
▪ Low coherence eliminates optical interference, necessary for precision F/D spectroscopy
measurement - Coherent length: ~ 50 μm
▪ Avoids the wavelengths of other applications utilizing visible light
▪ For True Non-Contact, dynamic contact, and contact AFM, LFM, force vs. distance spectroscopy, and phase
imaging. Other modes are available as options.
▪ Dovetail lock head mount is used for easy mount/removal of the AFM head
▪ Includes the IR detection kit to locate the beam position of SLD
▪ NOTE: The XE AFM head of a different type need to be selected if an AFM head other than the default

Table-top Acoustic Enclosure - AE 101 (Including Table)
▪ Table-top designed Acoustic Enclosure
▪ Environmentally sealed acoustic enclosure to block external acoustic and light noise
▪ Ergonomic design for user convenience
▪ Dimension: 510 x 715 x 630 mm (outer dimension W x D x H)
▪ Weight: 40 kg
▪ REQUIRES Active Vibration Isolation Table (780-0420) or Passive Vibration Isolation Table (780-0415).

Active Vibration Isolation Table
▪ The active vibration isolation table is a super-isolator with direct velocity feedback via electromagnetic
transducers to cancel out the floor vibration.
▪ Strongly recommended for high resolution imaging.
Variable Enhanced Conductive AFM (VECA)
▪ Measures the conductivity of a sample with high lateral resolution and sensitivity
▪ Provides higher sensitivity and wider electric current range
▪ Includes the VECA module with a variable gain, low-noise current amplifier, software, and manual
- Gain range: 7 steps (10^3 to 10^9 V/A)
- Maximum measurable current range: -10 mA to 10 mA (at 10^3 V/A gain)
- Noise level: ~0.3 pA (rms, at 10^9 V/A gain)
▪ Includes pre-mounted conductive cantilevers (9 ea.)
▪ NOTE: Conductive AFM (C-AFM) Chip Carrier (700-0952) is needed for the cantilever mounting.

Enhanced EFM
▪ Includes Enhanced EFM: Dynamic Contact EFM (DC-EFM), Piezoresponse Force Microscopy (PFM)
Scanning Kelvin Probe Microscopy (KPFM), Dynamic Contact EFM (DC-EFM)
▪ Provides higher spatial resolution and measurement sensitivity than the standard EFM
▪ Includes software and EFM test samples
▪ Includes pre-mounted conductive cantilevers for Enhanced EFM (6 ea.)
▪ REQUIRES a lock-in amplifier (780-0001). See XE Mode Accessories
▪ NOTE: External high voltage toolkit (080-0603) and one of the high voltage amplifiers (080-0970, 080-
0971) are required for high bias voltage application above ±10 V.
Lock-in Amplifier
▪ Manufacturer: Stanford Research
▪ Part Number: SR830

분석료: 70,000원/시간